Journal Of Electronic Testing-theory And Applications SCIE
国际简称：J ELECTRON TEST 参考译名：电子测试理论与应用杂志
主要研究方向：工程：电子与电气-工程技术 非预警期刊 审稿周期： 较慢,6-12周
《电子测试理论与应用杂志》(Journal Of Electronic Testing-theory And Applications)是一本由Springer US出版的以工程：电子与电气-工程技术为研究特色的国际期刊，发表该领域相关的原创研究文章、评论文章和综述文章，及时报道该领域相关理论、实践和应用学科的最新发现，旨在促进该学科领域科学信息的快速交流。该期刊是一本未开放期刊，近三年没有被列入预警名单。
The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.
Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics:
Testing of VLSI devices printed circuit boards, and electronic systems;
Testing of analog and digital electronic circuits;
Testing of microprocessors, memories, and signal processing devices;
Fault modeling;
Test generation;
Fault simulation;
Testability analysis;
Design for testability;
Synthesis for testability;
Built-in self-test;
Test specification;
Fault tolerance;
Formal verification of hardware;
Simulation for verification;
Design debugging;
AI methods and expert systems for test and diagnosis;
Automatic test equipment (ATE);
Test fixtures;
Electron Beam Test Systems;
Test programming;
Test data analysis;
Economics of testing;
Quality and reliability;
CAD Tools;
Testing of wafer-scale integration devices;
Testing of reliable systems;
Manufacturing yield and design for yield improvement;
Failure mode analysis and process improvement
Journal Of Electronic Testing-theory And Applications期刊信息
- ISSN：0923-8174
- 出版语言：English
- 是否OA：未开放
- E-ISSN：1573-0727
- 出版地区：UNITED STATES
- 是否预警：否
- 出版商：Springer US
- 出版周期：Bimonthly
- 创刊时间：1990
- 开源占比：0.047
- Gold OA文章占比：9.56%
- OA被引用占比：0.0092...
- 出版国人文章占比：0
- 出版撤稿占比：0
- 研究类文章占比：100.00%
Journal Of Electronic Testing-theory And Applications CiteScore评价数据（2024年最新版）
| CiteScore | SJR | SNIP | CiteScore 指数 | ||||||||
| 2 | 0.271 | 0.518 |
|
名词解释：CiteScore 是衡量期刊所发表文献的平均受引用次数，是在 Scopus 中衡量期刊影响力的另一个指标。当年CiteScore 的计算依据是期刊最近4年（含计算年度）的被引次数除以该期刊近四年发表的文献数。例如，2022年的 CiteScore 计算方法为：2022年的 CiteScore =2019-2022年收到的对2019-2022年发表的文件的引用数量÷2019-2022年发布的文献数量 注：文献类型包括：文章、评论、会议论文、书籍章节和数据论文。
Journal Of Electronic Testing-theory And Applications中科院评价数据
中科院 2023年12月升级版
| Top期刊 | 综述期刊 | 大类学科 | 小类学科 | ||
| 否 | 否 | 工程技术 | 4区 | ENGINEERING, ELECTRICAL & ELECTRONIC 工程：电子与电气 | 4区 |
中科院 2022年12月升级版
| Top期刊 | 综述期刊 | 大类学科 | 小类学科 | ||
| 否 | 否 | 工程技术 | 4区 | ENGINEERING, ELECTRICAL & ELECTRONIC 工程：电子与电气 | 4区 |
中科院 2021年12月旧的升级版
| Top期刊 | 综述期刊 | 大类学科 | 小类学科 | ||
| 否 | 否 | 工程技术 | 4区 | ENGINEERING, ELECTRICAL & ELECTRONIC 工程：电子与电气 | 4区 |
中科院 2021年12月基础版
| Top期刊 | 综述期刊 | 大类学科 | 小类学科 | ||
| 否 | 否 | 工程技术 | 4区 | ENGINEERING, ELECTRICAL & ELECTRONIC 工程：电子与电气 | 4区 |
中科院 2021年12月升级版
| Top期刊 | 综述期刊 | 大类学科 | 小类学科 | ||
| 否 | 否 | 工程技术 | 4区 | ENGINEERING, ELECTRICAL & ELECTRONIC 工程：电子与电气 | 4区 |
中科院 2020年12月旧的升级版
| Top期刊 | 综述期刊 | 大类学科 | 小类学科 | ||
| 否 | 否 | 工程技术 | 4区 | ENGINEERING, ELECTRICAL & ELECTRONIC 工程：电子与电气 | 4区 |
Journal Of Electronic Testing-theory And Applications JCR评价数据（2023-2024年最新版）
| 按JIF指标学科分区 | 收录子集 | 分区 | 排名 | 百分位 |
| 学科：ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q4 | 278 / 352 |
21.2% |
| 按JCI指标学科分区 | 收录子集 | 分区 | 排名 | 百分位 |
| 学科：ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q4 | 293 / 354 |
17.37% |
Journal Of Electronic Testing-theory And Applications历年数据统计
影响因子
中科院分区
Journal Of Electronic Testing-theory And Applications中国学者发文选摘
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1、A Layout-Based Rad-Hard DICE Flip-Flop Design
Author: Haibin Wang, Xixi Dai, Younis Mohammed Younis Ibrahim, Hongwen Sun, Issam Nofal, Li Cai, Gang Guo, Zicai Shen, Li Chen
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2019, Vol., , DOI:10.1007/s10836-019-05773-4
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2、A Semantics-based Translation Method for Automated Verification of SystemC TLM Designs
Author: Yanyan Gao, Xi Li
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 685-695, DOI:10.1007/s10836-013-5406-8
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3、Efficient Test Compression Technique for SoC Based on Block Merging and Eight Coding
Author: Tie-Bin Wu, Heng-Zhu Liu, Peng-Xia Liu
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 849-859, DOI:10.1007/s10836-013-5415-7
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4、An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis
Author: Yongcai Ao, Yibing Shi, Wei Zhang, Yanjun Li
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 555-565, DOI:10.1007/s10836-013-5382-z
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5、Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction
Author: Lung-Jen Lee
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 625-634, DOI:10.1007/s10836-013-5404-x
-
6、Prognostics of Analog Filters Based on Particle Filters Using Frequency Features
Author: Min Li, Weiming Xian, Bing Long, Houjun Wang
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 567-584, DOI:10.1007/s10836-013-5383-y
-
7、A Novel Compact Model for On-Chip Vertically-Coiled Spiral Inductors
Author: Bing Hou, Tong Liu, Jun Liu, Junli Chen, Faxin Yu, Wenbo Wang
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2016, Vol.32, 649-652, DOI:10.1007/s10836-016-5613-1
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8、Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits
Author: Haibin Wang, Mulong Li, Xixi Dai, Shuting Shi, Li Chen, Gang Guo
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2015, Vol.32, 97-103, DOI:10.1007/s10836-015-5559-8
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